John C. Stover

Surface Characterization for Computer Disc Wafers

1999

Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II

1998

Flatness, roughness, and discrete defect characterization for computer disks, wafers, and flat panel displays

1996

Optical Scattering in the Optics, Semiconductor, and Computer Disk Industries

1995

Optical scatter

1991

Optical scattering

1990

Scatter from optical components

1989