Fred H. Pollak

Diagnostic Techniques for Semiconductor Materials Processing II Vol. 406

1996

Layered structures

1990

Photoreflectance for in-situ c

Photoreflectance for in-situ characterization of MOCVD growth of semiconductors under micro-gravity conditions

1990

Surface and interface analysis of microelectronic materials processing and growth

1990

Spectroscopic characterization techniques for semiconductor technology III

1988

Modern optical characterization techniques for semiconductors and semiconductor devices

1987

Spectroscopic characterization techniques for semiconductor technology II

1985

Spectroscopic charcterization techniques for semiconductor technology

1984