David G. Seiler

Metrology and Diagnostic Techn

Metrology and Diagnostic Techniques for Nanoelectronics

2017

Characterization and metrology for ULSI technology, 2000

2001

Semiconductor characterization

1996

Improved characterization and

Improved characterization and evaluation measurements for HgCdTe detector materials, processes, and devices used on the GOES and TIROS satellites

1994

Spectroscopy of Semiconductors

1992

Narrow-gap semiconductors and

Narrow-gap semiconductors and related materials

1990